Screening of the deformation field in a solid by point defects

Physics of the Solid State

Volumn 43, Issue 4, 2001, Pages 663-664

  Emel'yanov, V I ^a  

^a MOSCOW STATE UNIVERSITY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035315149     PISSN: 10637834     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.1365989     Document Type: Article

References (7)

1. V. I. Emel'yanov and I. M. Panin, Fiz. Tverd. Tela (St. Petersburg) 39 (11), 2029 (1997) [Phys. Solid State 39, 1815 (1997)].
2. V. I. Emel'yanov and I. M. Panin, Fiz. Tverd. Tela (St. Petersburg) 39 (11), 2029 (1997) [Phys. Solid State 39, 1815 (1997)].
3. V. I. Emel'yanov and I. M. Panin, Fiz. Tverd. Tela (St. Petersburg) 42 (6), 1026 (2000) [Phys. Solid State 42, 1058 (2000)].
4. V. I. Emel'yanov and I. M. Panin, Fiz. Tverd. Tela (St. Petersburg) 42 (6), 1026 (2000) [Phys. Solid State 42, 1058 (2000)].
5. J. D. Eshelby, Solid State Phys. 3, 79 (1956).
6. V. I. Emel'yanov and I. M. Panin, Proc. SPIE 3734, 294 (1999).
7. L. D. Landau and E. M. Lifshitz, in Statistical Physics (Nauka, Moscow, 1976; Pergamon, Oxford, 1980), Part 1.