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Volumn 44, Issue 6, 2001, Pages 867-872
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Local texture measurements in a SiC/Ti composite manufactured by the foil-fibre-foil technique
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Author keywords
Composite; Electron diffraction; Texture; X ray diffraction
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Indexed keywords
ANISOTROPY;
BACKSCATTERING;
CONSOLIDATION;
ELECTRON DIFFRACTION;
INTERFACES (MATERIALS);
SILICON CARBIDE;
TITANIUM;
VOLUME FRACTION;
X RAY DIFFRACTION ANALYSIS;
ELECTRON BACKSCATTERING DIFFRACTION (EBSD) METHOD;
FOIL-FIBER-FOIL METHOD;
COMPOSITE MATERIALS;
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EID: 0035312855
PISSN: 13596462
EISSN: None
Source Type: Journal
DOI: 10.1016/S1359-6462(00)00701-6 Document Type: Article |
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Times cited : (16)
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References (9)
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