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Volumn 44, Issue 6, 2001, Pages 985-989

Microstructural characterization of V-doped single-phase titanium aluminide

Author keywords

Intermetallic; Microstructure; Ordered domain; Transmission Electron Microscopy (TEM)

Indexed keywords

DOPING (ADDITIVES); ENERGY DISPERSIVE SPECTROSCOPY; GRINDING (COMMINUTION); INTERMETALLICS; METAL MELTING; METALLOGRAPHIC MICROSTRUCTURE; TRANSMISSION ELECTRON MICROSCOPY; VANADIUM;

EID: 0035310863     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6462(00)00691-6     Document Type: Article
Times cited : (3)

References (10)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.