Polarization-resolved linewidth-power product of a vertical-cavity semiconductor laser

Journal of Applied Physics

Volumn 89, Issue 7, 2001, Pages 4183-4185

  Willemsen, M B ^a   Van De Nes, A S ^a   Van Exter, M P ^a   Woerdman, J P ^a   Kicherer, M ^b   King, R ^b   Jager R ^b   Ebeling, K J ^b  

^a LEIDEN UNIVERSITY   (Netherlands)

^b UNIVERSITY OF ULM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035310007     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1352673     Document Type: Article

References (8)

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2. B. Möller, E. Zeeb, U. Fiedler, T. Hackbarth, and K. J. Ebeling, IEEE Photonics Technol. Lett. 6, 921 (1994);
3. W. Schmid, C. Jung, B. Weigl, G. Reiner, R. Michalzik, and K. J. Ebeling, 8, 1288 (1996).
4. Using a self-heterodyne setup we are also sensitive to optical frequency fluctuations during the delay time. This was a problem for measurements with the longer fiber delay high above threshold, where the linewidth is narrow. In this case we determined the linewidth by extracting the Lorentzian component out of a noise spectrum, with a Voigt-like shape.
5. Z. Toffano, A. Destrez, C. Birocheau, and L. Hassine, Electron. Lett. 28, 9 (1992).
6. D. V. Kuksenkov, H. Temkin, and S. Swirhun, Appl. Phys. Lett. 66, 1720 (1995).
7. A closer inspection of Fig. 2 shows that the linewidth of the lasing mode also exhibits anomalous behavior, as for M=1.0-1.26 it is slightly above the ST value.
8. M. P. van Exter, M. B. Willemsen, and J. P. Woerdman, Phys. Rev. A 58, 4191 (1998).