Stability measurements on noise sources

IEEE Transactions on Instrumentation and Measurement

Volumn 50, Issue 2, 2001, Pages 368-372

  Randa, J ^a,b   Dunleavy, Lawrence P ^a,c   Terrell, Leon A ^b  

^a IEEE   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^c University of South Florida   (United States)

Author keywords

Noise; Noise measurement; Noise source; Noise temperature; Stability; Thermal noise

Indexed keywords

NOISE SOURCE; NOISE TEMPERATURE; STABILITY MEASUREMENT;

CALIBRATION; ELECTRIC DISCHARGES; FIELD EFFECT TRANSISTORS; RADIOMETRY; SEMICONDUCTOR DIODES; SPURIOUS SIGNAL NOISE; TEMPERATURE; THERMAL NOISE;

SIGNAL NOISE MEASUREMENT;

EID: 0035308942     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.918144     Document Type: Article

References (6)