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Although the RTR transients of the 50 nm film obtained with ns resolution shown in Fig. 1 suggest the occurrence of an interfacial solidification process towards the surface for all the fluences studied, recent RTR measurements with ps resolution on the same film have revealed the occurrence of surface initiated solidification at high fluences (Refs. 22 and 23). The ns temporal resolution of the technique used in the present work is not sufficient to resolve the ultrafast reflectivity oscillations occurring in a 50 nm thick film whereas they can easily be resolved for thicker films, as seen in Fig. 1
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