High-frequency characterization of twisted-pair cables

IEEE Transactions on Communications

Volumn 49, Issue 4, 2001, Pages 598-601

  Schutt Ainé, José E ^a,b  

^a IEEE   (United States)

^b University of Illinois at Urbana Champaign   (United States)

Author keywords

Loss; Scattering parameters; Skin effect; Twisted pairs

Indexed keywords

TIME-DOMAIN REFLECTOMETER; TWISTED-PAIR CABLES;

APPROXIMATION THEORY; COMPUTER SIMULATION; CURVE FITTING; ELECTRIC IMPEDANCE; ELECTRIC NETWORK ANALYZERS; ELECTROMAGNETIC WAVE PROPAGATION; MATHEMATICAL MODELS; REFLECTION; REFLECTOMETERS; SCATTERING PARAMETERS; SKIN EFFECT; TRANSMISSION LINE THEORY;

TELECOMMUNICATION CABLES;

EID: 0035307919     PISSN: 00906778     EISSN: None     Source Type: Journal    
DOI: 10.1109/26.917765     Document Type: Letter

References (7)