Comparison of four QHR systems within one month using a temperature and pressure stabilized 100-Ω resistor

IEEE Transactions on Instrumentation and Measurement

Volumn 50, Issue 2, 2001, Pages 238-241

  Satrapinski, Alexandre ^a   Seppä, Hekki ^b   Schumacher, Bernd ^c   Warnecke, Peter ^c   Delahaye, François ^d   Poirier, Wilfrid ^e   Piquemal, Françoise ^e  

^a CENTRE FOR METROLOGY AND ACCREDITATION MIKES   (Finland)

^b VTT TECHNICAL RESEARCH CENTRE OF FINLAND   (Finland)

^c PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

^d PAVILLON DE BRETEUIL   (France)

^e Bureau Veritas LCIE   (France)

Author keywords

Hall effect; Resistance measurements; Transfer standards

Indexed keywords

ELECTRIC RESISTANCE MEASUREMENT; HEAT RESISTANCE; RESISTORS; SENSORS; TEMPERATURE CONTROL; THERMAL EFFECTS; THERMISTORS; TWO TERM CONTROL SYSTEMS;

TRANSFER STANDARDS;

HALL EFFECT;

EID: 0035307859     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.918111     Document Type: Article

References (9)