A measurement of complex permittivity of lossy dielectrics by using flanged rectangular waveguide

Electronics and Communications in Japan, Part II: Electronics (English translation of Denshi Tsushin Gakkai Ronbunshi)

Volumn 84, Issue 4, 2001, Pages 59-67

  Hirano, Makoto ^a   Takahashi, Masaharu ^a   Abe, Minoru ^a  

^a TOKYO CITY UNIVERSITY   (Japan)

Author keywords

Complex permittivity; Contour chart; Flanged rectangular waveguide; Spectral domain method

Indexed keywords

CONTOUR MEASUREMENT; ELECTRIC NETWORK ANALYSIS; ELECTROMAGNETIC WAVE ATTENUATION; ELECTROMAGNETIC WAVE REFLECTION; NONDESTRUCTIVE EXAMINATION; PERMITTIVITY MEASUREMENT; RECTANGULAR WAVEGUIDES; SPECTRUM ANALYSIS;

CONTOUR CHARTS;

DIELECTRIC MATERIALS;

EID: 0035307217     PISSN: 8756663X     EISSN: None     Source Type: Journal    
DOI: 10.1002/ecjb.1022     Document Type: Article

References (10)

1. Measurement of complex permittivity with a flanged rectangular waveguide: Number of higher order modes needed to compute the fundamental-mode reflection coefficient
2. Coefficient of reflection from a lossy dielectric in a flanged rectangular waveguide
3. Electromagnetic field analysis of a lossy dielectric between a flanged rectangular waveguide and a conductor
4. Spectral domain method