A Bragg silicon lattice comparator

IEEE Transactions on Instrumentation and Measurement

Volumn 50, Issue 2, 2001, Pages 608-611

  Alasia, Franco ^a   Basile, Giuseppe ^a   Becker, P ^b   Kuetgens, U ^b   Stuempel, J ^b   Servidori, Marco ^c   Härtwig, Jürgen ^d  

^a Istituto di Metrologia Gustavo Colonnetti   (Italy)

^b PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

^c CNR   (Italy)

^d EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

Avogadro constant; Lattice parameters; Silicon

Indexed keywords

ANGLE MEASUREMENT; INTERFEROMETERS; LATTICE CONSTANTS; MECHANICAL PROPERTIES; SILICON; SINGLE CRYSTALS; SYNCHROTRON RADIATION; THERMODYNAMIC STABILITY; X RAY DIFFRACTION ANALYSIS;

ANGULAR POSITION; AVOGADRO CONSTANT; BRAGG SILICON LATTICE COMPARATOR; SILICON CRYSTALS; X RAY ANGLE INTERFEROMETER;

COMPARATORS (OPTICAL);

EID: 0035306943     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.918203     Document Type: Article

References (7)