Characterization of Ce1-xZrxO2 thin films prepared by pyrolytic spray technique

Solid State Ionics

Volumn 140, Issue 3-4, 2001, Pages 369-374

  Elidrissi, B ^a   Addou, M ^a   Regragui, M ^a   Mzerd, A ^b   Bougrine, A ^a   Kachouane, A ^a  

^a IBN TOFAIL UNIVERSITY   (Morocco)

^b FACULTÉ DES SCIENCES   (Morocco)

Author keywords

Ce1 xZrxO2; Characterization; Counter electrode; Spray pyrolysis; Thin films

Indexed keywords

CERIUM COMPOUNDS; CRYSTAL STRUCTURE; CYCLIC VOLTAMMETRY; ELECTRODES; FILM PREPARATION; LITHIUM COMPOUNDS; MICROANALYSIS; PYROLYSIS; RAMAN SPECTROSCOPY; SOLID ELECTROLYTES; THIN FILMS; TRANSPARENCY; X RAY DIFFRACTION ANALYSIS;

CERIUM ZIRCONIUM OXIDE; ELECTRON PROBE MICROANALYSIS (EPMA); SPRAY PYROLYSIS;

OPTICAL FILMS;

EID: 0035305769     PISSN: 01672738     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-2738(01)00675-0     Document Type: Article

References (22)

1. Opara Krasovec U., Orel B., Reisfield R. Electrochem. Solid State Lett. 1:1998;104.
2. Orel Z.C., Orel B. J. Mater. Sci. 30:1995;2284.
3. Veszelei M., Stromme Mattsson M., Kullman L., Azens A., Granqvist C.G. Sol. Energy Mater. Sol. Cells. 56:1999;223.
4. Granqvist C.G., Azens A., Hjelm A., Kullman L., Niklasson G.A., Ronnow D., Stromme Mattsson M., Veszelei M., Vaivars G. Sol. Energy Sol. Cells. 63:1998;199.
5. Azens A., Kullman L., Ragan D.D., Granqvist C.G., Hjorvarsson B., Vaivars G. Appl. Phys. Lett. 68:1996;3701.
6. Baudry P., Rodrigues A.C.M., Aegerter M.A., Bulhoes L.O. J. Non-Cryst. Solids. 121:1990;319.
7. Lavrencic Stangar U., Opara U., Orel B. J. Sol-Gel Sci. Technol. 8:1997;751.
8. Veszelei M., Kullman L., Stromme Mattsson M., Azens A., Granqvist C.G. J. Appl. Phys. 83:1998;1670.
9. Veszelei M., Kullman L., Azens A., Granqvist C.G., Hjorvarsson B. J. Appl. Phys. 81:1997;2024.
10. Inoue T., Yamomoto Y., Koyama S., Suzuki S., Ueda Y. Appl. Phys. Lett. 56:1990;1332.
11. Kullman L., Azens A., Grainqvist C.G. J. Appl. Phys. 81:1997;8002.
12. Meng F.L., Guang L., Zheng X.M., Zhong Y.J., Ting H.W. J. Mater. Sci. Lett. 17:1998;1553.
13. Elidrissi B., Addou M., Regragui M., Bougrine A. Leban. Sci. Res. Rep. 3:1998;230.
14. Addou M., Moumin A., Elidrissi B., Regragui M., Bougrine A., Kachouane A., Monty C. J. Chim. Phys. 96:1999;232.
15. Ratcheva T., Nanova M. Thin Solid Films. 202:1991;243.
16. Regragui M., Addou M., Outzourhit M., Elidrissi B., Kachouane A., Bougrine A. Thin Solid Films. 358:2000;40.
17. Lee C.H., Huang C.S. Mater. Sci. Eng., B. 22:1994;233.
18. ASTM File No. 13-307 (1972).
19. Sherrer P. Gottinger Nachr. 2:1918;98.
20. Furukawa T., Fox K., White W. J. Chem. Phys. 75:1981;3226.
21. Mochizuki S. Phys. Status Solidi B. 114:1982;189.
22. Graham G.H., Weber H.W., Peters C.R., Usmen R. J. Catal. 130:1991;310.