메뉴 건너뛰기




Volumn 30, Issue 4, 2001, Pages 415-421

Fatigue crack growth behavior in 63Sn-37Pb and 95Pb-5Sn solder materials

Author keywords

Crack path; Creep effect; Fatigue crack growth; Solder; Stress ratio

Indexed keywords

CRACK PROPAGATION; CRACKS; CREEP; EUTECTICS; FATIGUE OF MATERIALS; STRESS ANALYSIS; THERMAL EFFECTS;

EID: 0035305462     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-001-0053-8     Document Type: Article
Times cited : (9)

References (21)
  • 11
    • 0006652936 scopus 로고
    • ed. J.H. Lau New York: Van Nostrand Reinhold
    • H.D. Solomon, Solder Joint Reliability, ed. J.H. Lau (New York: Van Nostrand Reinhold, 1991), p. 406.
    • (1991) Solder Joint Reliability , pp. 406
    • Solomon, H.D.1
  • 15
    • 0000602614 scopus 로고
    • ed. S. Flugge Berlin: Springer
    • G.R. Irwin, Fracture, Handbuch der Physik VI, ed. S. Flugge (Berlin: Springer, 1958), pp. 551-590.
    • (1958) Fracture, Handbuch der Physik , vol.6 , pp. 551-590
    • Irwin, G.R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.