Casimir force in a critical film formed from an electrolytic solution

Physical Review E - Statistical Physics, Plasmas, Fluids, and Related Interdisciplinary Topics

Volumn 63, Issue 4, 2001, Pages

  Mukhopadhyay, A ^a   Law, B M ^a  

^a KANSAS STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACETIC ACID; ADSORPTION; BINARY MIXTURES; ELECTROLYTES; ELLIPSOMETRY; FREE ENERGY; MATHEMATICAL MODELS; SILICON WAFERS; SUBSTRATES; THERMAL EFFECTS;

CASIMIR FORCES;

THICK FILMS;

EID: 0035304910     PISSN: 1063651X     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevE.63.041605     Document Type: Article

References (35)

1. Finite Size Scaling and Numerical Simulations of Statistical Systems, edited by V. Privman (World Scientific, Singapore, 1990).
2. A. Mukhopadhyay and B. M. Law, Phys. Rev. Lett. 83, 772 (1999).
3. R. Garcia and M. H. W. Chan, Phys. Rev. Lett. 83, 1187 (1999).
4. M. E. Fisher and P.-G. de Gennes, C. R. Seances Acad. Sci., Ser. B 287, 207 (1978).
5. A. J. Liu and M. E. Fisher, Phys. Rev. A 40, 7202 (1989).
6. M. Krech, The Casimir Effect in Critical Systems (World Scientific, Singapore, 1994), and references therein.
7. M. Krech and S. Dietrich, Phys. Rev. Lett. 66, 345 (1991);
8. Phys. Rev. Lett.M. KrechS. Dietrich67, 1055 (1991);
9. M. KrechS. DietrichPhys. Rev. A 46, 1886 (1992).
10. A. Mukhopadhyay and B. M. Law, Phys. Rev. E 62, 5201 (2000).
11. R. F. Kayser, Phys. Rev. B 34, 3254 (1986).
12. J. N. Israelachvili, Intermolecular and Surface Forces (Academic, London, 1991), 2nd ed.
13. I. E. Dzyalosninskii, E. M. Lifshitz, and L. P. Pitaevskii, Adv. Phys. 10, 165 (1961).
14. E. S. Sabisky and C. H. Anderson, Phys. Rev. A 7, 790 (1973);
15. V. Panella, R. Chiarello, and J. Krim, Phys. Rev. Lett. 76, 3606 (1996).
16. N. V. Churaev and B. V. Derjaguin, J. Colloid Interface Sci. 103, 542 (1985).
17. R. F. Kayser, J. Phys. (France) 49, 1027 (1988).
18. R. F. Kayser, Phys. Rev. Lett. 56, 1831 (1986).
19. I. Langmuir, Science 88, 430 (1938).
20. The temperature dependencies of C and W have been neglected in Eq. (9). They are not well understood; they will depend upon the absolute temperature T rather than the reduced temperature t. Perhaps, at most, C and W might exhibit a weak linear dependence upon T. In Ref. 2 we neglected any temperature dependence associated with W for nonionic films and found scaling for the function (Formula presented) when plotted against (Formula presented). A posteriori therefore the temperature dependence of W is indeed small otherwise scaling would not have been found.
21. D. Beaglehole, Physica B and C 100, 163 (1980).
22. R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, Amsterdam, 1987).
23. D. Beaglehole, in Fluid Interfacial Phenomena, edited by C. A. Croxton (Wiley, New York, 1986).
24. P. Drude, The Theory of Optics (Dover, New York, 1959).
25. W. Kern and D. A. Puotinen, RCA Rev. 31, 187 (1970).
26. J. H. Carpenter, B. M. Law, and D. S. P. Smith, Phys. Rev. E 59, 5655 (1999).
27. The value of the Hamaker constant for the mixture AN on a Si wafer substrate listed in Table I (Formula presented) is approximately two to three orders of magnitude smaller than theoretical expectation 8. The DLP theory predicts a film thickness of the order of (Formula presented) at (Formula presented) for organic liquids on a Si wafer substrate, in contrast to our observations of only (Formula presented) for the film thickness at this height. We believe that the small value for the “effective” Hamaker constant W is due to the fact that AN probably only partially wets the Si wafer surface; Eq. (3) is strictly only correct under complete wetting conditions.
28. M. P. Nightingale and J. O. Indekeu, Phys. Rev. Lett. 54, 1824 (1985);
29. J. O. Indekeu, M. P. Nightingale, and W. V. Wang, Phys. Rev. B 34, 330 (1986);
30. M. Krech, Phys. Rev. E 56, 1642 (1997);
31. Z. Borjan and P. J. Upton, Phys. Rev. Lett. 81, 4911 (1998).
32. P. Debye and K. Kleboth, J. Chem. Phys. 42, 3155 (1965);
33. J. Chem. Phys.M. J. Cooper, 48, 4272 (1968);
34. Y. Yosida, Phys. Lett. A 65, 161 (1978).
35. Handbook of Chemistry and Physics, 66th ed., edited by R. C. Weast, M. J. Astle, and W. H. Beyer (CRC, Boca Raton, 1985).