Cell dynamics simulations of shear-induced alignment and defect annihilation in stripe patterns formed by block copolymers

Physical Review E - Statistical Physics, Plasmas, Fluids, and Related Interdisciplinary Topics

Volumn 63, Issue 4, 2001, Pages

  Ren, S R ^a   Hamley, I W ^a   Teixeira, P I C ^a   Olmsted, P D ^a  

^a UNIVERSITY OF LEEDS   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

POLYMER;

CHEMISTRY; DIFFUSION; KINETICS; MECHANICAL STRESS; OSCILLOMETRY; STATISTICAL MODEL; TEMPERATURE; TIME;

DIFFUSION; KINETICS; MODELS, STATISTICAL; OSCILLOMETRY; POLYMERS; STRESS, MECHANICAL; TEMPERATURE; TIME FACTORS;

ANNEALING; BIREFRINGENCE; BOUNDARY CONDITIONS; COMPUTER SIMULATION; ELECTRIC FIELD EFFECTS; GAUSSIAN NOISE (ELECTRONIC); GRAIN BOUNDARIES; KINETIC THEORY; MATHEMATICAL MODELS; MORPHOLOGY; RHEOLOGY; SHEAR DEFORMATION; SHEAR FLOW; THERMAL NOISE;

CELL DYNAMICS SIMULATION (CDS); STRIPE PATTERNS;

BLOCK COPOLYMERS;

EID: 0035304453     PISSN: 1063651X     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevE.63.041503     Document Type: Article

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