A miniature high-performance magnetic-field probe for measuring high-frequency currents

NEC Research and Development

Volumn 42, Issue 2, 2001, Pages 246-250

  Masuda, Norio ^a   Tamaki, Naoya ^a   Watanabe, Takeshi ^a   Ishizaka, Kazuyoshi ^a  

^a NONE

Author keywords

Current; EMI (Electromagnetic Interference); Glass ceramic; Loop probe; LSI; Magnetic field; Multi layer boards

Indexed keywords

COMPUTER SIMULATION; ELECTRIC CURRENTS; GLASS CERAMICS; LSI CIRCUITS; MAGNETIC FIELD MEASUREMENT; MATHEMATICAL MODELS; MULTILAYERS; NATURAL FREQUENCIES; OPTICAL RESOLVING POWER; PRINTED CIRCUIT BOARDS; SIGNAL INTERFERENCE;

MAGNETIC FIELD PROBES;

PROBES;

EID: 0035303491     PISSN: 0547051X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (5)

1. H. Irino, et al., "SPICE Simulation of Power Supply Current from LSI on PCB with a Behavioral Model," EMC'99 Int. Symp. in Tokyo, 19A106, pp.224-227, 1999.
2. "Measurement of Conducted Emissions, Magnetic Probe Method IEC 61967 - 6 (Committee Draft for Vote)," 2000-11.
3. N. Masuda, et al., "RF Current Evaluation of ICs by MP-10L," NEC Res. & Develop., 40, 2, pp.253-258, 1999-4.
4. N. Masuda, et al., "A Multilayer Board-type Magnetic Field Loop Probe with High Spatial Resolution and RF Current Estimation Method for ICs," EMC'99 Int. Symp. in Tokyo, 801, 1999.
5. H. Sasaki, et al., "A new decoupling circuit for suppressing radiated emissions from multilayer printed circuit boards," IEEE EMC Int. Symp. in Washington, D.C., 1E-4, pp.157-162, 2000.