|
Volumn 175, Issue 177, 2001, Pages 314-318
|
The control of gold nanocluster sizes and volume fraction in dielectric thin films via ion-beam assisted deposition
|
Author keywords
Gold nanocluster; Ion beam assisted deposition; XRD
|
Indexed keywords
COMPRESSIVE STRESS;
CRYSTAL LATTICES;
EVAPORATION;
GOLD;
ION BEAM ASSISTED DEPOSITION;
NANOSTRUCTURED MATERIALS;
SILICA;
STRAIN;
THIN FILMS;
VOLUME FRACTION;
X RAY DIFFRACTION ANALYSIS;
NANOCLUSTERS;
DIELECTRIC FILMS;
|
EID: 0035302892
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-583X(00)00638-8 Document Type: Article |
Times cited : (3)
|
References (6)
|