On the thermal behavior of giant magnetoresistance heads

Journal of Tribology

Volumn 123, Issue 2, 2001, Pages 380-387

  Gupta, B K ^a   Young, K ^a   Chilamakuri, S K ^a   Menon, A K ^a  

^a WESTERN DIGITAL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; ATOMIC FORCE MICROSCOPY; ELECTRIC CURRENTS; FINITE ELEMENT METHOD; OPTIMIZATION; THERMAL EFFECTS; THERMAL EXPANSION; TRANSDUCERS;

POLE TIN RECESSION (PTR);

GIANT MAGNETORESISTANCE;

MAGNETISM;

EID: 0035300587     PISSN: 07424787     EISSN: None     Source Type: Journal    
DOI: 10.1115/1.1308005     Document Type: Article

References (6)

1. Nanotechnology a data storage perspective
2. Characterization of the head-disk interface at nanometer dimensions
3. Limitation and correction of optical profilometry in surface characterization of carbon coated magnetic recording disks
4. Pole tip recession measurements on thin film heads using optical profilometry with phase correction and atomic force microscopy
5. Finite element analysis of planar stress anisotropy and thermal behavior in thin films