The formation of domain boundaries in the Iw phase of Y-Si-Al-O-N and Er-Si-Al-O-N

Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties

Volumn 81, Issue 4, 2001, Pages 867-882

  Maclaren, Ian ^a   Falk, Lena K L ^a   Díaz, Aranzazu ^b   Hampshire, Stuart ^b  

^a CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

^b UNIVERSITY OF LIMERICK   (Ireland)

Author keywords

[No Author keywords available]

Indexed keywords

COALESCENCE; CRYSTAL ORIENTATION; CRYSTALLIZATION; CRYSTALLOGRAPHY; ERBIUM COMPOUNDS; HEAT TREATMENT; HIGH RESOLUTION ELECTRON MICROSCOPY; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

ORIENTATIONAL DOMAIN BOUNDARIES;

YTTRIUM COMPOUNDS;

EID: 0035297860     PISSN: 01418610     EISSN: None     Source Type: Journal    
DOI: 10.1080/01418610151133311     Document Type: Article

References (13)

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