Simulation of atomic force microscopy of fractal nanostructured carbon films

Europhysics Letters

Volumn 54, Issue 1, 2001, Pages 72-76

  Bogana, M ^a   Donadio, D ^a   Benedek, G ^a   Colombo, L ^b  

^a UNIVERSITY OF MILANO BICOCCA   (Italy)

^b UNIVERSITY OF CAGLIARI   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035297763     PISSN: 02955075     EISSN: None     Source Type: Journal    
DOI: 10.1209/epl/i2001-00230-6     Document Type: Article

References (10)

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9. FERRARI A. C., SATYANARAYANA B. S., ROBERTSON J., MILNE W. I., BARBORINI E., PISERI P. and MILANI P., Europhys. Lett., 46 (1999) 245.
10. We remark that the supercell size limits considerably the possibility of simulating the effects of the AFM tip radius as large as those used in experiments and does not allow to extrapolate the growth exponent β if the height-height correlation function saturates beyond about one half of the simulation cell edge, due to the adoption of in-plane periodic boundary conditions.