Applications of combined EXAFS and powder diffraction analysis in solid state chemistry

Journal of Synchrotron Radiation

Volumn 8, Issue 2, 2001, Pages 305-307

  Binsted, Norman ^a   Stange, Marit ^b   Owens, Craig ^a   Fjellvåg, Helmer ^b   Weller, Mark T ^a  

^a UNIVERSITY OF SOUTHAMPTON   (United Kingdom)

^b UNIVERSITY OF OSLO   (Norway)

Author keywords

Combined refinement; EXAFS; Powder diffraction

Indexed keywords

ARTICLE;

EID: 0035294196     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049500020276     Document Type: Article

References (7)

1. Binsted, N., Pack, M., Weller, M. T., and Evans, J. (1996). J.Am.Chem.Soc.118, 10200-10210.
2. Weller, M. T., Pack, M. J. and Binsted, N. (1996). Angew. Chem. Int. Ed., 37, 1094-1097.
3. Binsted, N., Dann, S. E., Pack, M., and Weller, M. T. (1998),.Acta Cryst., B54, 558-563.
4. Binsted, N., Stange, M., Fjellvåg, H and Weller, M.T. (2001). Submitted to the proceedings of the LLD2K conference.
5. McGreevy, R. L. (1995). Nucl. Instrum. Methods, A354, 1-16.
6. Rehr, J. J. and Albers, R. C. (1990). Phys. Rev., B41, 8139-8149.
7. Altermatt, D. and Brown, I. D. (1985). Acta Cryst., 41, 240-244.