EXAFS measurements for liquid Ge-Si alloys

Journal of Synchrotron Radiation

Volumn 8, Issue 2, 2001, Pages 767-769

  Inui, Masanori ^a   Matsusaka, Tetsuya ^a   Ishikawa, Daisuke ^a   Sakaguchi, Yoshifumi ^a   Hong, Xinguo ^a   Kazi, Moynul Huq ^a   Tamura, Kozaburo ^a  

^a HIROSHIMA UNIVERSITY   (Japan)

Author keywords

EXAFS measurements at high temperature; Liquid Ge Si alloys; Local structure

Indexed keywords

ARTICLE;

EID: 0035291648     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049500016058     Document Type: Article

References (11)

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