Development of multipurpose laboratory XIEES spectrometer and its application to surface XAFS analysis of Al2O3 films

Journal of Synchrotron Radiation

Volumn 8, Issue 2, 2001, Pages 360-362

  Lee, Jae Cheol ^b   Song, Se Ahn ^b   Yuryev, Yury ^b   Terada, Yasuko ^a   Nakai, Izumi ^a   Lim, Chang Bin ^b  

^a TOKYO UNIVERSITY OF SCIENCE   (Japan)

^b Samsung Advanced Institute of Technology (SAIT)   (South Korea)

Author keywords

Laboratory XAFS; Surface analysis; XIEES

Indexed keywords

ARTICLE;

EID: 0035288873     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049500014266     Document Type: Article

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