Site-selective XAFS spectroscopy tuned to surface active sites of Cu/ZnO and Cr/SiO2 catalysts

Journal of Synchrotron Radiation

Volumn 8, Issue 2, 2001, Pages 605-607

  Izumi, Yasuo ^a   Nagamori, Hiroyasu ^a   Kiyotaki, Fumitaka ^a   Minato, Taketoshi ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Active site; Energy resolution; Fluorescence spectroscopy; Site selective; XAFS

Indexed keywords

ARTICLE;

EID: 0035288751     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049500013881     Document Type: Article

References (6)

1. Ankudinov, A. L., Ravel, B., Rehr, J. J., and Condradson, S. D. (1998). Phys. Rev. B 58, 7565-7576.
2. Georgopoulos, P. and Knapp, G. S. (1981). J. Appl. Crystallogr. 14, 3-7.
3. Izumi, Y. and Nagamori, H. (2000). Bull. Chem. Soc. Jpn. 73, 1581-1587.
4. Izumi, Y., Oyanagi, H., and Nagamori, H. (2000). Bull. Chem. Soc. Jpn. 73, 2017-2023.
5. Rehr, J. J., Mustre de Leon, J., Zabinsky, S. I., and Albers (1991). J. Am. Chem. Soc. 113, 5135-5140.
6. Stojanoff, V., Hamalainen, K., Siddons, D. P., Hastings, J. B., Berman, L. E., Cramer, S., and Smith, G. (1992). Rev. Sci. Instrum. 63, 1125-1127.