Optical dilatometry for the control of microstructure development during sintering

Materials Research Innovations

Volumn 4, Issue 4, 2001, Pages 245-250

  Raether, F ^a   Springer, R ^a   Beyer, S ^a  

^a FRAUNHOFER INSTITUTE FOR SILICATE RESEARCH ISC   (Germany)

Author keywords

CCD camera; Dilatometry; Non contact; Optical; Shrinkage; Sintering

Indexed keywords

EID: 0035285926     PISSN: 14328917     EISSN: None     Source Type: Journal    
DOI: 10.1007/s100190000101     Document Type: Article

References (20)

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