Measurements and diagnostics of diamond films and coatings

Measurement: Journal of the International Measurement Confederation

Volumn 29, Issue 2, 2001, Pages 113-126

  Miyoshi, Kazuhisa ^a   Wu, Richard L C ^b  

^a NASA GLENN RESEARCH CENTER   (United States)

^b K Systems Corporation   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL VAPOR DEPOSITION; COATINGS; ELECTRON DIFFRACTION; RAMAN SPECTROSCOPY; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SURFACE MEASUREMENT; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

DIAGNOSTIC METHODOLOGY; ELASTIC RECOIL SPECTROSCOPY; STYLUS PROFILOMETRY;

DIAMOND FILMS;

EID: 0035283953     PISSN: 02632241     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0263-2241(00)00032-4     Document Type: Article

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