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Volumn 35, Issue 3, 2001, Pages 187-198
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A novel optical method in micro drop deformation measurements
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Author keywords
Deformation; Fast Fourier transform; Laser Doppler anemometry; Profile measurement
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Indexed keywords
ANEMOMETERS;
DEFORMATION;
DROP FORMATION;
FAST FOURIER TRANSFORMS;
GEOMETRICAL OPTICS;
LIGHT INTERFERENCE;
LIGHT SCATTERING;
PROFILOMETRY;
SUBSTRATES;
SURFACE TENSION;
LASER DOPPLER ANEMOMETRY;
MICRO-DROP DEFORMATIONS;
LASER DOPPLER VELOCIMETERS;
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EID: 0035278231
PISSN: 01438166
EISSN: None
Source Type: Journal
DOI: 10.1016/S0143-8166(01)00002-1 Document Type: Article |
Times cited : (3)
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References (15)
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