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Volumn 41, Issue 3, 2001, Pages 395-405
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Investigations on double-diffused MOS transistors under ESD zap conditions
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Author keywords
[No Author keywords available]
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Indexed keywords
BIPOLAR TRANSISTORS;
DIFFUSION;
ELECTRIC CONTACTS;
ELECTRIC DISCHARGES;
ELECTRIC RESISTANCE;
ELECTROSTATICS;
ELECTROSTATIC DISCHARGES (ESD);
MOSFET DEVICES;
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EID: 0035278221
PISSN: 00262714
EISSN: None
Source Type: Journal
DOI: 10.1016/S0026-2714(00)00240-7 Document Type: Article |
Times cited : (7)
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References (9)
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