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Volumn 460, Issue 1, 2001, Pages 165-184

Processing of silicon UV-photodetectors

Author keywords

[No Author keywords available]

Indexed keywords

ANTIREFLECTION COATINGS; ELECTRIC FIELD EFFECTS; INTERFACES (MATERIALS); OXIDATION; PHOTODIODES; SEMICONDUCTING SILICON; SILICA;

EID: 0035277059     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(00)01111-6     Document Type: Article
Times cited : (8)

References (16)
  • 6
    • 0004246662 scopus 로고
    • INSPEC, (Ed.), The Institution of Electrical Engineers, London and New York, ISBN 0 85296 475 7
    • INSPEC, T.H. Ning (Ed.), 'Properties of silicon', The Institution of Electrical Engineers, London and New York, 72 and 1019, 1988, ISBN 0 85296 475 7.
    • (1988) 'Properties of Silicon' , vol.72-1019
    • Ning, T.H.1
  • 8
    • 0004242004 scopus 로고
    • INSPEC, (Ed.), The Institution of Electrical Engineers, London and New York, ISBN 0 85296 485 4
    • INSPEC, M.H. Brodsky (Ed.), 'Properties of Gallium Arsenide', 2nd Edition, The Institution of Electrical Engineers, London and New York, 157, 1990 ISBN 0 85296 485 4.
    • (1990) 'Properties of Gallium Arsenide', 2nd Edition , vol.157
    • Brodsky, M.H.1
  • 13
    • 85031528697 scopus 로고    scopus 로고
    • Medici, Technology Modeling Associates, Inc., version 4.1
    • Medici, Technology Modeling Associates, Inc., version 4.1.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.