High-resolution soft X-ray bulk sensitive photoemission from strongly correlated systems

Journal of Electron Spectroscopy and Related Phenomena

Volumn 114-116, Issue , 2001, Pages 659-668

  Suga, Shigemasa ^a   Sekiyama, Akira ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC DENSITY OF STATES; FERMI LEVEL; HIGH RESOLUTION ELECTRON MICROSCOPY; PHOTOELECTRON SPECTROSCOPY;

X-RAY BULK SENSITIVE PHOTOEMISSION;

PHOTOEMISSION;

EID: 0035276567     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0368-2048(00)00313-3     Document Type: Article

References (10)

1. Saitoh Y., Nakatani T., Matsushita T., et al. J. Synchrotron Rad. 5:1998;542.
2. Saitoh Y., Kimura H., Suzuki Y., et al. Rev. Sci. Instrum. 71:2000;3254.
3. S. Suga, Nucl. Instrum. Meth. (2000), in press.
4. Sekiyama A., Iwasaki T., Matsuda K., Saitoh Y., Onuki Y., Suga S. Nature. 403:2000;396.
5. Gerken F., Flodstrom A.S., Barth J., Johansson L.I., Kunz C. Physica Scripta. 32:1985;43.
6. Tjeng L.H., Oh S.-J., Cho E.-J., et al. Phys. Rev. Lett. 71:1993;1419.
7. Joyce J.J., Arko B.J., Bartlett R.J., et al. Phys. Rev. B. 54:1996;17515.
8. Sekiyama A., Kadono K., Matsuda K., et al. J. Phys. Soc. Jpn. Lett. 69:2000;2771.
9. A. Sekiyama, unpublished.
10. Iwasaki T., Ueda S., Matsushita T., et al. Phys. Rev. B. 61:2000;4621.