Detailed structure analysis of deposit layer in TEXTOR by means of TEM techniques

Journal of Nuclear Materials

Volumn 290-293, Issue , 2001, Pages 295-298

  Muto, S ^a   Yokoya, N ^a   Tanabe, T ^a  

^a NAGOYA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; BORON; DOPING (ADDITIVES); ELECTRON DIFFRACTION; ELECTRON ENERGY LOSS SPECTROSCOPY; GRAPHITE; TRANSMISSION ELECTRON MICROSCOPY;

GRAPHITE BELT LIMITERS;

TOKAMAK DEVICES;

EID: 0035276406     PISSN: 00223115     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3115(00)00576-6     Document Type: Article

References (7)

1. G. Mank, V. Philipps, H.G. Esser, W. Biel, M. Brix, K.H. Finken, A. Pospieszczyk, Physica Scripta T81 (1999) 70.
2. M. Rubel, V. Philipps, A. Huber, T. Tanabe, Physica Scripta T81 (1999) 61.
3. A. Pospieszczyk, V. Philipps, A. Huber, A. Kirschner, B. Schweer, E. Vietzke, Physica Scripta T81 (1999) 48.
4. K. Ohya, T. Tanabe, M. Wada, T. Ohgo, V. Philipps, B. Unterberg, A. Pospieszczyk, B. Schweer, A. Huber, N. Noda, Nucl. Instrum. Meth. Phys. Res. B. 153 (1999) 354.
5. P. Villars, L.D. Calvert, Pearson's Handbook of Crystallographic Data for Intermetallic Phases, vol. l ASM, 1985.
6. R.A. Rosenberg, P.J. Love, V. Rehn, Phys. Rev. B 33 (1986) 4034.
7. V. Serin, R. Brydson, A. Scott, Y. Kihn, O. Abidate, B. Maquin, A. Derre, Carbon 38 (2000) 547.