Momentum profiles of aluminum

Journal of Electron Spectroscopy and Related Phenomena

Volumn 114-116, Issue , 2001, Pages 1031-1036

  Vos, M ^a   Kheifets, A S ^a   Weigold, E ^a  

^a AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; BAND STRUCTURE; ELECTRON SCATTERING; ELECTRON SPECTROSCOPY; THIN FILMS;

ELECTRON MOMENTUM SPECTROSCOPY; MOMENTUM DENSITY;

METALLIC FILMS;

EID: 0035276108     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0368-2048(00)00284-X     Document Type: Article

References (12)

1. Hüfner S. Photoelectron Spectroscopy. 1995;Springer, Berlin.
2. Cooper M. Rep. Prog. Phys. 48:1985;415.
3. Weigold E., McCarthy I. Electron Momentum Spectroscopy. 1999;Kluwer Academic/Plenum, New York.
4. Neudatchin V., Popov Y.V., Smirnov Y.F. Physics-Uspekhi. 42:1999;1017.
5. Vos M., McCarthy I. Rev. Mod. Phys. 67:1995;713.
6. Vos M., Cornish G., Weigold E. Rev. Sci. Instrum. 71:2000;3831.
7. Vos M., Weigold E. J. Electron Spectrosc. Relat. Phenom. 112:2000;93.
8. Storer P., Caprari R., Clark S., Vos M., Weigold E. Rev. Sci. Instrum. 65:1994;2214.
9. Vos M., Kheifets E.W.A.S., Canney S., Holm B., Aryasetiawan F., Karlsson K. J. Phys.: Condens. Matter. 11:1999;3645.
10. M. Vos, S. Canney, D. Lun, E. Weigold, J. Phys. IV 9 (1999) Pr6-153.
11. Vos M., Bottema M. Phys. Rev. B. 54:1996;5946.
12. Canney S., Vos M., Kheifets A., Clisby N., McCarthy I., Weigold E. J. Phys.: Condens. Matter. 9:1997;1931.