Optical characterization of porous materials

Physica Status Solidi (A) Applied Research

Volumn 184, Issue 1, 2001, Pages 51-78

  Rossow, U ^a,b  

^a ILMENAU UNIVERSITY OF TECHNOLOGY   (Germany)

^b TECHNICAL UNIVERSITY OF BRAUNSCHWEIG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE MATERIALS; DIELECTRIC PROPERTIES OF SOLIDS; ELECTROCHEMISTRY; ELLIPSOMETRY; ETCHING; NANOSTRUCTURED MATERIALS; POROSITY; SPECTROSCOPIC ANALYSIS;

ELECTROCHEMICAL ETCHING; SPECTROSCOPIC ELLIPSOMETRY;

POROUS SILICON;

EID: 0035275973     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-396X(200103)184:1<51::AID-PSSA51>3.0.CO;2-Q     Document Type: Article

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