Inelastic electron tunneling spectroscopy measurements using adjustable oxide-free tunnel junctions

Review of Scientific Instruments

Volumn 72, Issue 3, 2001, Pages 1781-1787

  Zimmerman, Darin T ^a   Agnolet, Glenn ^b  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

^b TEXAS A AND M UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035274060     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1347382     Document Type: Article

References (27)

1. R. C. Jaklevic and J. Lambe, Phys. Rev. Lett. 17, 1139 (1966).
2. K. W. Hipps and U. Mazur, J. Phys. Chem. 97, 7803 (1993), and references therein.
3. P. K. Hansma, Tunneling Spectroscopy: Capabilities, Applications, and New Techniques (Plenum, New York, 1982), and articles therein.
4. P. K. Hansma, Phys. Rep. 30C, 145 (1977).
5. S. Gregory, Phys. Rev. Lett. 64, 689 (1990).
6. S. Gregory, Phys. Rev. B 44, 12868 (1991).
7. J. R. Kirtley and P. K. Hansma, Phys. Rev. B 12, 531 (1975).
8. D. T. Zimmerman, M. B. Weimer, and G. Agnolet, Appl. Phys. Lett. 75, 2500 (1999).
9. D. T. Zimmerman, Ph.D. dissertation. Texas A&M University (1997), Chap. 11.
10. The 1 K pot has an operating temperature of 1.33 K without a heat load and 1.58 K with a heat load of 1 mW.
11. Cajon Company, Macedonia, OH 44056.
12. Emerson & Cuming Composite Materials, Inc., Canton, MA 02021.
13. MALCO, A Microdot Co., So. Pasadena, CA 91030, Part No. 141-0002-0002.
14. California Fine Wire Co., Grover Beach, CA 93483.
15. Minco Products, Inc., Minneapolis, MN 55432-3177, Table 3-100.
16. Motorola, Inc., Semiconductor Products Sector, Phoenix, AZ 85018.
17. Douglas Battery Mfg. Co., Winston-Salem, NC 27117-2159.
18. E. L. Wolf, Principles of Electron Tunneling Spectroscopy (Oxford University Press, New York, 1985), p. 346.
19. Most of this parasitic capacitance is due to the coupling between the copper wires needed to clean the electrode wires. By using independent shields for each pair of copper wires, we have been able to reduce this capacitance to less than 0.05 pF.
20. EG&G Princeton Applied Research Corporation, Model 124A.
21. P. K. Hansma, IBM J. Res. Dev. 30, 370 (1986).
22. W. F. Brinkman, R. C. Dynes, and J. M. Rowell, J. Appl. Phys. 41, 1915 (1970).
23. G. Agnolet, S. R. Savilski, and D. T. Zimmerman, Physica B 284-288, 1840 (2000).
24. J. Klein, A. Leger, M. Belin, D. Defourneau, and M. J. L. Sangster, Phys. Rev. B 7, 2336 (1973).
25. Peakfit Version 4, Jandel Scientific Software (SPSS Science), Chicago, IL 60606-6307.
26. A. M. Baro, H. Ibach, and H. D. Bruchmann, Surf. Sci. 88, 384 (1979).
27. M. E. Alikhani, B. Silvi, and J. P. Perchard, J. Chem. Phys. 90, 5221 (1989).