MIM shunt-capacitor model using black boxes of EM-simulated critical parts

IEEE Transactions on Microwave Theory and Techniques

Volumn 49, Issue 3, 2001, Pages 559-562

  Gerhard, Gregor ^a   Koch, Stefan ^a  

^a Siemens Enterprise Communications GmbH & Co KG   (Germany)

Author keywords

Capacitor; EM simulation; MIM; Model

Indexed keywords

ELECTROMAGNETIC FIELD SOLVERS; LUMPED ELEMENTS; SHUNT CAPACITORS;

CAPACITANCE; CAPACITORS; COMPUTER SIMULATION; ELECTROMAGNETIC FIELD EFFECTS; MICROSTRIP LINES; MONOLITHIC MICROWAVE INTEGRATED CIRCUITS;

MIM DEVICES;

EID: 0035273815     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/22.910564     Document Type: Article

References (6)

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