Binary segmentation of aggregate in SEM image analysis of concrete

Cement and Concrete Research

Volumn 31, Issue 3, 2001, Pages 437-441

  Yang, R ^a   Buenfeld, N R ^a  

^a IMPERIAL COLLEGE LONDON   (United Kingdom)

Author keywords

Aggregate; Backscattered electron imaging; Concrete; Image analysis; SEM

Indexed keywords

ALGORITHMS; BACKSCATTERING; CEMENTS; ELECTRON SCATTERING; IMAGE ANALYSIS; IMAGE SEGMENTATION; PARTICLE SIZE ANALYSIS; SCANNING ELECTRON MICROSCOPY;

BACKSCATTERED ELECTRON IMAGING; BINARY SEGMENTATION; GREY-LEVEL THRESHOLDING;

CONCRETES;

EID: 0035271418     PISSN: 00088846     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0008-8846(00)00493-2     Document Type: Article

References (11)

1. Analysis of phases in cement paste using backscattered electron images
2. Quantitative backscattered electron analysis for cement paste
3. Backscattered electron image analysis of cement paste specimens: Specimen preparation and analytical methods
4. Image analysis techniques for characterization of pore structure of cement based materials
5. An approach to quantitative image analysis for cement pastes
6. Application of automated image analysis to the study of cement paste microstructure
7. Pore size distributions in hardened cement paste by SEM image analysis
8. A quantitative structural study of fresh cement paste by image analysis: Part 1. Image processing
9. Microstructural gradients in cement paste around aggregate in particles
10. Quantitative image analysis of masonry mortar microstructure