Analysis of atomic force curve data for mapping of surface properties in water

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 40, Issue 3 A, 2001, Pages 1420-1424

  Sirghi, Lucel ^a,c   Nakagiri, Nobuyuki ^b   Sugimura, Hiroyuki ^a   Takai, Osamu ^a  

^a NAGOYA UNIVERSITY   (Japan)

^b NIKON CORPORATION   (Japan)

^c ALEXANDRU IOAN CUZA UNIVERSITY OF IASI   (Romania)

Author keywords

Atomic force microscopy; Electric double layer force; Force versus distance curve; Hydration force

Indexed keywords

ALGORITHMS; CONFORMAL MAPPING; HYDRATION; SILICON NITRIDE; SILICON WAFERS; SURFACE PROPERTIES; WATER;

ATOMIC FORCE CURVES;

ATOMIC FORCE MICROSCOPY;

EID: 0035270443     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.40.1420     Document Type: Article

References (16)