Density of states distribution in A1N films measured by CPM and DLTS

Diamond and Related Materials

Volumn 10, Issue 3-7, 2001, Pages 1335-1339

  Ligatchev, V ^a   Yoon, S F ^a   Ahn, J ^a   Zhang, Q ^a   Rusli, ^a   Zhgoon, S ^b   Chew, K ^a  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

^b MOSCOW POWER ENGINEERING INSTITUTE   (Russian Federation)

Author keywords

Density of states distribution; Nitrides

Indexed keywords

ALUMINUM COMPOUNDS; DEEP LEVEL TRANSIENT SPECTROSCOPY; LIGHT ABSORPTION; MAGNETRON SPUTTERING; PARTIAL PRESSURE; PHOTOCURRENTS;

RADIO FREQUENCY;

DIAMONDS;

ALUMINUM NITRIDE;

EID: 0035269964     PISSN: 09259635     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-9635(00)00447-7     Document Type: Article

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