Characterization of the local layer structure of a narrow wall in a surface stabilized ferroelectric liquid crystal using synchrotron X-ray micro-diffraction

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 40, Issue 3 A, 2001, Pages 1345-1351

  Iida, Atsuo ^a   Noma, Takashi ^b   Miyata, Hirokatsu ^b  

^a INSTITUTE OF MATERIALS STRUCTURE SCIENCE   (Japan)

^b CANON INC   (Japan)

Author keywords

Ferroelectric liquid crystal; Local layer structure; Narrow wall; Synchrotron X rays; X ray microbeam; Zigzag defect

Indexed keywords

FERROELECTRIC MATERIALS; LAYERED MANUFACTURING; SURFACE TREATMENT; SYNCHROTRON RADIATION; X RAY DIFFRACTION ANALYSIS;

FERROELECTRIC LIQUID CRYSTALS; X-RAY MICRO-DIFFRACTION; ZIGZAG DEFECTS;

LIQUID CRYSTALS;

EID: 0035269770     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.40.1345     Document Type: Article

References (20)