Influence of defect inhomogeneities in high quality natural diamond detectors

Diamond and Related Materials

Volumn 10, Issue 3-7, 2001, Pages 469-473

  Tromson, D ^a   Amosov, V N ^b   Brambilla, A ^a   Mer, C ^a   Foulon, F ^a   Barrett, R ^c   Bergonzo, P ^a  

^a CEA LETI   (France)

^b TROITSK INSTITUTE FOR INNOVATION AND FUSION RESEARCH   (Russian Federation)

^c EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

Mirco beam analysis; Radiation detectors; Traps and defects

Indexed keywords

ALPHA PARTICLES; CRYSTAL DEFECTS; PHOTOCURRENTS; X RAY ANALYSIS;

NATURAL DIAMOND DETECTORS;

DIAMONDS;

DIAMOND;

EID: 0035269393     PISSN: 09259635     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-9635(00)00607-5     Document Type: Article

References (6)

1. Kozlov S.F. IEEE Trans. Nucl. Sci. 22:1975;160.
2. Kozlov S.F., Konorova E.A., Kuznetsov Y.A., et al. IEEE Trans. Nucl. Sci. 24:1977;235.
3. Souw E.K., Meilunas R.J. Nucl. Instr. Meth. A 400:1997;69.
4. Kozlov S.F., Stuck R., Hage-Ali M., et al. IEEE Trans. Nucl. Sci. 42:1975;160.
5. Champion F.C. Proc. Of the Phys. Soc. B 65:(7):1952;465.
6. D. Tromson, A. Brambilla, P. Bergonza et al., to be published in Diamond Relat. Mater.