Trapping-detrapping behavior in CVD diamond particle detectors

Diamond and Related Materials

Volumn 10, Issue 3-7, 2001, Pages 645-649

  Marinelli, Marco ^a   Milani, E ^a   Paoletti, A ^a   Tucciarone, A ^a   Verona Rinati, G ^a   Angelone, M ^b   Pillon, M ^b  

^a UNIVERSITY OF ROME TOR VERGATA   (Italy)

^b ASSOCIAZIONE EURATOM ENEA SULLA FUSIONE   (Italy)

Author keywords

CVD; Defects; Electrical properties; Modeling

Indexed keywords

CHEMICAL VAPOR DEPOSITION; COMPUTER SIMULATION; CRYSTAL DEFECTS; PARTICLE DETECTORS;

CHARGE COLLECTION DISTANCES (CCD); TRAPPING-DETRAPPING BEHAVIORS;

DIAMOND FILMS;

DIAMOND;

EID: 0035269260     PISSN: 09259635     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-9635(00)00514-8     Document Type: Article

References (10)

1. Adam W., Bauer C., Bedermann E., et al. Electrochem. Soc. 5th Symposiumon on Diamond Materials Proc. 1998;491.
2. Marinelli M., Milani E., Paoletti A., et al. Appl. Phys. Lett. 75:1999;3216.
3. Behnke T., Huntemeyer P., Oh A., Steuerer J., Wagner A., Zeuner V. Nucl. Instr. Meth. A414:1998;340.
4. Bergonzo P., Foulon F., Marshall R.D., et al. Diam. Relat. Mater. 8:1999;952.
5. Kania D.R. Paoletti A., Tucciarone A. The Physics of Diamond. 1997;IOS Press, Amsterdam.
6. Ramo S. Proc. I.R.E. 27:1939;584.
7. Hecht K. Z. Phys. 77:1932;235.
8. M. Marinelli, E. Milani, A. Paoletti, et al., Proc. of Applied Diamond Conference/Frontier Carbon Technology Joint Conference, Tsukuba, Japan, August 31-September 3, (1999) 154.
9. Martini M., Mc Math T.A. Nucl. Instr. Meth. 79:1970;259.
10. M. Marinelli, E. Milani, A. Paoletti, et al., (unpublished).