Investigation of magnetic flux trapping in high-T c thin films by scanning SQUID microscope

IEEE Transactions on Applied Superconductivity

Volumn 11, Issue 1 I, 2001, Pages 238-241

  Suzuki, Koji ^a,b   Adachi, Seiji ^a   Li, Yijie ^a,c   Utagawa, Tadashi ^a   Tanabe, Keiichi ^a  

^a SUPERCONDUCTIVITY RESEARCH LABORATORY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c Rice University   (United States)

Author keywords

Flux trapping; Moat; Nd Ba Cu O film; SQUID microscope

Indexed keywords

MAGNETIC FLUX TRAPPING; MOATS; SCANNING SUPERCONDUCTING QUANTUM INTERFERENCE DEVICE MICROSCOPE;

COOLING; MAGNETIC FLUX; MAGNETRON SPUTTERING; MICROSCOPES; NEODYMIUM COMPOUNDS; PHOTOLITHOGRAPHY; SQUIDS;

SUPERCONDUCTING FILMS;

EID: 0035268965     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.919328     Document Type: Conference Paper

References (7)

1. Magnetic imaging of moat-guarded superconducting electronic circuits
2. c superconducting quantum interference devices with slots or holes: Low 1/f noise in ambient magnetic fields
3. Imaging of magnetic vortices in superconducting networks and clusters by scanning SQUID microscope
4. c-Axis penetration depth of Hg-1201 single crystals
5. y thin-film patterns with slots
6. Micro-imaging system using scanning DC-SQUID microscope
7. 7-δ films grown by pulsed laser deposition with a single crystal target