Study of trapped flux in a superconducting thin film - Observation by scanning SQUID microscope and simulation

IEEE Transactions on Applied Superconductivity

Volumn 11, Issue 1 I, 2001, Pages 230-233

  Tanaka, Keiichi ^a   Morooka, Toshimitsu ^a   Odawara, Akikazu ^a   Mawatari, Yasunori ^b   Nakayama, Satoshi ^a   Nagata, Atsushi ^a   Ikeda, Masanori ^a   Chinone, Kazuo ^a   Koyanagi, Masao ^b  

^a SEIKO INSTRUMENTS INC   (Japan)

^b ELECTROTECHNICAL LABORATORY   (Japan)

Author keywords

Magnetic flux density; Scanning SQUID microscope system (SSM); Surface barrier; Trapped flux

Indexed keywords

COMPUTER SIMULATION; COOLING; MAGNETIC FLUX; MATHEMATICAL MODELS; MICROSCOPES; SQUIDS;

MAGNETIC FLUX TRAPPING; SCANNING SQUID MICROSCOPE;

SUPERCONDUCTING FILMS;

EID: 0035268835     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.919326     Document Type: Conference Paper

References (7)

1. Surface barrier in type- II superconductors
2. Edge barrier pinning for a single superconducting vortex
3. Magnetic imaging of moats-guarded superconducting electric circuits
4. Evaluation of trapped magnetic flux for Josephson 4-Kbit RAMs
5. Flux trapping in a superconducting thin film as revealed by simulations and scanning superconducting quantum interference device (SQUID) microscope observations
6. Micro-imaging system using scanning DC-SQUID microscope
7. Observation of trapped flux by scanning SQUID microscope with novel cooling system