Analog-to-digital converter testing method based on segmented correlations

IEEE Transactions on Applied Superconductivity

Volumn 11, Issue 1 I, 2001, Pages 275-279

  Bulzacchelli, John F ^a   Lee, Hae Seung ^a   Misewich, James A ^b   Ketchen, Mark B ^b  

^a USA   (United States)

^b IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

Analog to digital converters; Correlation; Delta sigma modulators; Spectral analysis

Indexed keywords

CORRELATION METHODS; DELTA SIGMA MODULATION; FOURIER TRANSFORMS; JOSEPHSON JUNCTION DEVICES; MODULATORS; SHIFT REGISTERS; SPECTRUM ANALYSIS; SUPERCONDUCTING DEVICES;

CROSS CORRELATION; DELTA SIGMA MODULATORS; FREQUENCY RESOLUTION;

ANALOG TO DIGITAL CONVERSION;

EID: 0035268472     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.919337     Document Type: Conference Paper

References (10)

1. A 6-bit Josephson flash A/D converter with GHz input bandwidth
2. Josephson sigma-delta modulator for high dynamic range A/D conversion
3. Design of SFQ-counting analog-to-digital converter
4. Progress in the development of a superconductive high-resolution ADC
5. Demonstration of Josephson sigma-delta analog-to-digital converters
6. Superconducting bandpass delta-sigma modulator
7. RSFQ 1024-bit shift register for acquisition memory