Tolerance of programmable Josephson voltage standard to noise and junction nonuniformity

IEEE Transactions on Applied Superconductivity

Volumn 11, Issue 1 I, 2001, Pages 271-274

  Kim, Kyu Tae ^a   Hong, Hyun Kwon ^b   Kim, Jinhee ^a   Lee, Kyu Won ^a   Song, Yang Sup ^a  

^a Korea Research Institute of Standards and Science   (South Korea)

^b Chungbuk National University   (South Korea)

Author keywords

Gaussian noise; Josephson voltage standard; Nonhysteretic Josephson junction; Nonuniformity

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); ELECTRIC POTENTIAL; ELECTRIC RESISTANCE; GAUSSIAN NOISE (ELECTRONIC); HYSTERESIS; MATHEMATICAL MODELS; MICROWAVES; STANDARDS;

NONHYSTERETIC JOSEPHSON JUNCTION; NONUNIFORMITY; PROGRAMMABLE JOSEPHSON VOLTAGE STANDARD;

JOSEPHSON JUNCTION DEVICES;

EID: 0035268471     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.919336     Document Type: Conference Paper

References (8)

1. Nb/Al/AlOx/Al/Nb Josephson junctions for programmable voltage standard
2. Stable 1 volt programmable voltage standard
3. A 10-V Josephson voltage standard
4. 3/Nb - Josephson voltage standard at 1 V and 10 V
5. Performance and reliability of NIST 10-V Josephson array
6. Josephson D/A converter with fundamental accuracy
7. Ac and dc bipolar voltage source using quantized pulses
8. Quasipotential and the stability of phase lock in nonhysteretic Josephson junctions