Imaging sub-millimeter waves in planar cryoelectronic circuits by scanning laser microscopy

IEEE Transactions on Applied Superconductivity

Volumn 11, Issue 1 I, 2001, Pages 716-720

  Abraimov, D ^a   Ustinov, A V ^a   Shitov, S V ^b  

^a UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

^b INSTITUTE OF RADIO ENGINEERING AND ELECTRONICS   (Russian Federation)

Author keywords

Integrated circuits; Oscillator; Scanning laser microscopy; SIS devices; Submillimeter wave devices; Superconducting transmission lines; Wave measurements

Indexed keywords

ELECTROMAGNETIC FIELD MEASUREMENT; LASER APPLICATIONS; LOW TEMPERATURE EFFECTS; MICROSCOPIC EXAMINATION; MILLIMETER WAVE DEVICES; SCANNING;

CRYOELECTRONIC CIRCUITS; LOW TEMPERATURE MICROSCOPY; SCANNING LASER MICROSCOPY; SUBMILLIMETER WAVES IMAGING; SUPERCONDUCTING TRANSMISSION LINES; SUPERCONDUCTOR INSULATOR SUPERCONDUCTOR DEVICES;

SUPERCONDUCTING DEVICES;

EID: 0035268341     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.919445     Document Type: Conference Paper

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