The variation of J cgb with GB misorientation and inclination measured using the Scanning SQUID Microscope

IEEE Transactions on Applied Superconductivity

Volumn 11, Issue 1 III, 2001, Pages 3880-3883

  Tsai, Jack W H ^a,e   Chan, Siu Wai ^a   Kirtley, John R ^b   Tidrow, S C ^c   Jiang, Q ^d  

^a Och Spine at New York Presbyterian Hospitals   (United States)

^b IBM T J WATSON RESEARCH CENTER   (United States)

^c U S ARMY RESEARCH LABORATORY   (United States)

^d UNIVERSITY OF HOUSTON   (United States)

^e MAXTOR CORPORATION   (United States)

Author keywords

Critical current density J c; Facetting; Grain boundary; Scanning SQUID microscopy

Indexed keywords

BOUNDARY INCLINATIONS; BOUNDARY MEANDERING; GRAIN BOUNDARY MISORIENTATION; ISLAND GROWTH MODE; JOSEPHSON PENETRATION LENGTH; SUPERCONDUCTING ORDER PARAMETERS;

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CRYSTAL ORIENTATION; CRYSTAL SYMMETRY; DEPOSITION; FILM GROWTH; GRAIN BOUNDARIES; SCANNING ELECTRON MICROSCOPY; SQUIDS; STRONTIUM COMPOUNDS; SUPERCONDUCTING FILMS; YTTRIUM BARIUM COPPER OXIDES;

JOSEPHSON JUNCTION DEVICES;

EID: 0035268275     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.919914     Document Type: Conference Paper

References (10)