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Volumn 11, Issue 1 III, 2001, Pages 3106-3109

2212-Tl-Ba-Ca-Cu-O films on 3″ sapphire wafers for high frequency filters

Author keywords

Cryogenic electronic; Mobile communication; Thin film devices

Indexed keywords

BANDPASS FILTERS; CRACKS; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); FILM PREPARATION; SAPPHIRE; THICKNESS MEASUREMENT;

EID: 0035268250     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.919720     Document Type: Conference Paper
Times cited : (10)

References (10)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.