Sub-gap leakage in Nb/AlOx/Nb and Al/AlOx/Al Josephson junctions

IEEE Transactions on Applied Superconductivity

Volumn 11, Issue 1 I, 2001, Pages 1002-1005

  Gubrud, M A ^a   Ejrnaes, M ^b   Berkley, A J ^a   Ramos Jr , R C ^a   Jin, I ^c   Anderson, J R ^a   Dragt, A J ^a   Lobb, C J ^a   Wellstood, F C ^a  

^a UNIVERSITY OF MARYLAND   (United States)

^b TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

^c SEAGATE TECHNOLOGY   (United States)

Author keywords

Decoherence; Dissipation; Josephson junctions; Quantum computation

Indexed keywords

ALUMINA; CAPACITANCE; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC RESISTANCE; EVAPORATION; LEAKAGE CURRENTS; NIOBIUM; QUANTUM THEORY; SEMICONDUCTOR DEVICE MANUFACTURE; THERMAL NOISE;

DOUBLE-ANGLE EVAPORATION; PLASMA FREQUENCY; QUANTUM COMPUTATION; SUB-GAP LEAKAGE CURRENT;

JOSEPHSON JUNCTION DEVICES;

EID: 0035268144     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.919518     Document Type: Conference Paper

References (7)

1. Quantum superposition of distinct macroscopic states
2. Prospects for quantum coherent computation using superconducting electronics
3. Josephson persistent-current qubit