A microwave broadband technique to measure the complex resistivity of HTS thin films

IEEE Transactions on Applied Superconductivity

Volumn 11, Issue 1 III, 2001, Pages 3082-3085

  Tosoratti, Nevio ^a   Fastampa, Renato ^a   Giura, Maurizio ^a   Lenzi, Vasco ^a   Sarti, Stefano ^a   Silva, Enrico ^b  

^a SAPIENZA UNIVERSITY OF ROME   (Italy)

^b ROMA TRE UNIVERSITY   (Italy)

Author keywords

Broadband reflection measurements; Coaxial to circular transition; Complex resistivity of high Tc superconducting thin films

Indexed keywords

ELECTRIC CONDUCTIVITY MEASUREMENT; ELECTRIC CONTACTS; ELECTROMAGNETIC WAVE REFLECTION; HIGH TEMPERATURE SUPERCONDUCTORS; MICROWAVES; SUPERCONDUCTING CABLES; SUPERCONDUCTING TRANSITION TEMPERATURE; WAVEGUIDES; YTTRIUM BARIUM COPPER OXIDES;

COAXIAL TO CYLINDRICAL TRANSITION; COMPLEX RESISTIVITY; ELECTROMAGNETIC ANALYSIS; MICROWAVE BROADBAND TECHNIQUE;

SUPERCONDUCTING FILMS;

EID: 0035267946     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.919714     Document Type: Conference Paper

References (9)

1. A broadband method for the measurement of the surface impedance of thin films at microwave frequencies
2. Investigations of superconducting fluctuations through broadband microwave conductivity experiments
3. Effective and intrinsic surface impedances of high-Tc superconducting thin films
4. The effective surface resistance of superconductor/dielectric/metal structures
5. Broadband simultaneous measurement of complex permittivity and permeability using a coaxial discontinuity
6. Single and double sided YBCO thin films for X-band microwave filters and devices