On-wafer measurements of nonlinear effects in high temperature superconductors

IEEE Transactions on Applied Superconductivity

Volumn 11, Issue 1 I, 2001, Pages 1387-1391

  Booth, J C ^a   Vale, L R ^a   Ono, R H ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

High temperature superconductors; Microwave devices; Nonlinear response

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); FILM GROWTH; MICROWAVE DEVICES; MICROWAVE MEASUREMENT; SUPERCONDUCTING FILMS; YTTRIUM BARIUM COPPER OXIDES;

NONLINEAR EFFECTS; ON-WAFER MEASUREMENT;

HIGH TEMPERATURE SUPERCONDUCTORS;

EID: 0035267916     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.919610     Document Type: Conference Paper

References (12)

1. Third-order harmonic generation in high-temperature superconducting coplanar waveguides at microwave frequencies
2. NIST passive intermodulation measurement comparison for wireless base station equipment
3. Simultaneous optimization of the linear and nonlinear microwave response of YBCO films and devices
4. Conductor loss in superconducting planar structures: Calculation and measurements
5. A multiline method of network analyzer calibration
6. Power-dependent impedance of high temperature superconductor thin films: Relation to harmonic generation
7. Full 2-port calibrated S-parameter measurements up to 30 W of high temperature superconducting filters
8. Measurement of resonant frequency and quality factor of microwave resonators: Comparison of methods
9. Geometry dependence of nonlinear effects in high temperature superconducting transmission lines at microwave frequencies
10. Theory of intermodulation in a superconducting microstrip resonator
11. Current distribution for superconducting strip transmission lines